Distributed parameters line model with frequency-dependent parameters
Simscape / Electrical / Specialized Power Systems / Fundamental Blocks
The Distributed Parameters Line (Frequency-Dependent) block implements a multiphase distributed parameter line model with high-fidelity frequency-dependent parameters. It performs accurate transient response simulations for a wide frequency range (typically from DC to 100 kHz or more).
The geometry of the line and the frequency-dependent model parameters are defined in a MAT-file that is associated with the block. The MAT-file must be edited with the Power Line Parameters app, which computes the RLC line parameters for a defined range of frequencies and applies a fitting algorithm that converts the line parameters into a rational model. Rational fitting for this model is performed by using the vector fitting (VF) procedure. For more information on the phase domain line model and the state-space analysis, see [1].
[1] Ramos-Leanos, O., and R. Iracheta. "Wide-Band Line Model Implementation in Matlab for EMT Analysis." Paper presented at the IEEE North American Power Symposium (NAPS), Arlington, TX, 26-28 Sept. 2010. https://ieeexplore.ieee.org/document/5618959
[2] Ramos-Leanos, O. "Wideband Line/Cable Models for Real-Time and Off-Line Simulations of Electromagnetic Transients." Paper presented at Diss. École Polytechnique de Montréal, April 2013. https://publications.polymtl.ca/1134/1/2013_OctavioRamosLeanos.pdf
[3] Ramos-Leanos, Octavio, José Luis Naredo, Jean Mahseredjian, Christian Dufour, José Alberto Gutierrez-Robles, and Ilhan Kocar. “A Wideband Line/Cable Model for Real-Time Simulations of Power System Transients.” IEEE Transactions on Power Delivery 27, no. 4 (October 2012): 2211–18. https://ieeexplore.ieee.org/document/6263255
[4] Iracheta, R., and O. Ramos-Leanos. "Improving computational efficiency of FD line model for real-time simulation of EMTS." Paper presented at the IEEE North American Power Symposium (NAPS), Arlington, TX, 26-28 Sept. 2010. https://ieeexplore.ieee.org/document/5618953