The generation of a temperature profile based on switching and conduction losses in an insulated-gate bipolar transistor (IGBT). There are two buck converters. For one converter, the IGBT attaches to a Foster thermal model. For the other converter, the IGBT attaches to a Cauer thermal model. The parameters for the thermal models are tuned to give roughly equivalent results. At a simulation time of 50ms, the driving frequency changes from 40kHz to 20kHz, which increases the conduction losses and decreases the switching losses. The change in the losses results in a corresponding change in the temperature of the IGBT.